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| Agilent N4373C 67 GHz Single-Mode Lightwave Component Analyzer for 40/100G electro-optical test Data Sheet www..com General Information Agilent's N4373C Lightwave Component Analyzer (LCA) offers a modulation bandwidth of 67 GHz which makes it the ideal choice to develop and characterize electro-optical components, for the upcoming 40G/10GbE as defined in IEEE802.3ba. Key benefits High absolute and relative accuracy measurements improve the yield of development and production processes. With the excellent accuracy and reproducibility, measurement results can be compared among test locations world wide. High confidence and fast time-to-market with a NISTtraceable turnkey solution. Significantly increased productivity using the fast and easy measurement setup with an unique new calibration process leads to lower cost of test. External optical source input option to test at customer selected wavelength. Common PNA and LCA user interface across all N437xB/C LCA series. Identical LCA software and remote control across the N437xB family simplifies integration. Relative frequency response uncertainty: 0.8 dB @ 50 GHz (typ) 1.3 dB @ 65 GHz (typ) Absolute frequency response uncertainty: 1.2 dB @ 50 GHz (typ) 1.8 dB @ 65 GHz (typ) Noise floor: -60(55) dB(A/W) for O/E measurements @ 50(65) GHz -64(59) dB(W/A) for E/O measurements @ 50(65) GHz Typical phase uncertainty: 2.3 Transmitter wavelength: 1550nm 20 nm 1310nm 10 nm 1290 - 1610 nm with external source input Built-in optical power meter For fast transmitter power verification Powerful remote control: State of the art programming interface based on Microsoft .NET or COM. Warranty: 1 year warranty is standard for the N4373C Lightwave Component Analyzer. Extension to 3 or 5 years available on request. Accuracy For these modern optical transmission systems with advanced modulation schemes it is key for the electro-optical components to have very flat S21 transfer function in amplitude and delay. This performance can be achieved only with electro-optical S-parameter test as provided by the N4373C LCA. In addition fast, accurate, repeatable and traceable characterization of these electro-optical components, like lasers, modulators and detectors is required, to guarantee the performance with respect to modulation bandwidth, jitter, gain, and distortion. By optimizing the electrical and the optical design of the N4373C for lowest noise and ripple, the accuracy has been improved by better than a factor of 2, compared to its predecessor, the 86030A 50GHz LCA. This increased accuracy improves the yield from tests performed with the N4373C by narrowing margins needed to pass the tested devices. This advanced design together with temperature-stabilized transmitter and receiver ensures repeatable measurements over hours without recalibration Turn-key solution The fully integrated "turn-key" N4373C helps reduce time to market, compared to the time-consuming development of a self-made setup. In addition you get a fully specified easy transferable and reliable test instrument. With guaranteed specifications Agilent takes the responsibility to provide you with accurate and traceable test results that can only be achieved in a turn key solution. High productivity The N4373C achieves fast measurements by including the E8361C Performance Network Analyzer. A unique new calibration concept significantly reduces setup time to a maximum of several minutes, depending on the selected measurement parameters. This results in increased productivity in R&D or on the manufacturing floor. Using the advanced measurement capabilities of the network analyzer, all S-parameter related characteristics of the device under www..com test, like responsivity and 3dB-cutoff frequency, can be qualified with the new N4373C Lightwave Component Analyzer from 10 MHz to 67 GHz. Network analyzer The N4373C LCA is based on the new E8361C network analyzer with an identical and well known user interface across all Agilent network analyzers. 2 Agilent N4373C Applications In digital photonic transmission systems, the performance is ultimately determined by Bit Error Ratio Test (BERT). As this parameter describes the performance of the whole system, it is necessary to design and qualify subcomponents like modulators and PIN detectors, which are analog by nature, with different parameters that reflect their individual performance. These components significantly influence the overall performance of the transmission system with the following parameters: 3dB bandwidth of the electro-optical transmission. Relative frequency response, quantifying the electrooptical shape of the conversion. Absolute frequency response, relating to the conversion efficiency of signals from the input to the output, or indicating the gain of a receiver. Electrical reflection at the RF port. Group delay of the electro-optical transfer function. Only a careful design of these electro-optical components over a wide modulation signal bandwidth guarantees successful operation in the transmission system. Agilent N4373C Features Turnkey solution In today's highly competitive environment, short time-tomarket with high quality is essential for new products. Instead of developing a home-grown measurement solution, which takes a lot of time and is limited in transferability and support, a fully specified and supported solution helps to focus resources on faster development and on optimizing the manufacturing process. In the N4373C all optical and electrical components are carefully selected and matched to each other to minimize noise and ripple in the measurement traces. Together with the temperature stabilized environment of the core components, this improves the repeatability and the accuracy of the overall system. Extended factory calibration data at various optical power levels ensures accurate and reliable measurements that can only be achieved with an integrated solution like the N4373C. Easy calibration An LCA essentially measures the conversion relation between optical and electrical signals. This is why user calibration of such systems can evolve into a time consuming task. With the new calibration process implemented in the N4373C, the tasks that have to be done by the user are reduced to one pure electrical calibration. The calibration with an electrical calibration module is automated and needs only minimal manual interaction. Electro-optical components The frequency response of detector diodes, modulators and directly modulated lasers typically depends on various parameters, like bias voltages, optical input power, operating current and ambient temperature. To determine the optimum operating point of these devices, an LCA helps by making a fast characterization of the electro-optic transfer function while optimizing these operating conditions. In manufacturing it is important to be able to monitor the processes in regular time slots to keep up the throughput and yield. In this case the LCA is the tool of choice to monitor transmission characteristic and absolute responsivity of the manufactured device. Built-in performance verification Sometimes it is necessary to make a quick verification of the validity of the calibration and the performance of the system. The N4373C's unique calibration process allows the user to perform a self-test without external reference devices. This gives full confidence that the system performance is within the user's required uncertainty bands. State-of-the-art remote control Testing the frequency response of electro-optical components under a wide range of parameters, which is often necessary in qualification cycles, is very time consuming. To support the user in minimizing the effort for performing this huge number of tests, all functions of the LCA can be controlled remotely via LAN over the state-of-the-art Microsoft .NET or COM interface. This interface is identical for all LCA of the N437xB/C series. Based on programming examples for VBA with Excel, Agilent VEE and C++, it is very easy for every user to build applications for their requirements. These examples cover applications like integration of complete LCA measurement sequences. Electrical components Electrical components such as amplifiers, filters and transmission lines are used in modern transmission systems and require characterization to ensure optimal performance. Typical measurements are bandwidth, insertion loss or gain, impedance match and group delay. www..com 3 Integrated optical power meter In applications where optical power dependence characterization is needed, the average power meter can be used to set the exact average output power of the LCA transmitter by connecting the LCA optical transmitter output, optionally through an optical attenuator, to the LCA optical receiver input. By adjusting the transmitter output power in the LCA user interface or the optical attenuation, the desired transmitter optical power can be set. In cases where an unexpectedly low responsivity is measured from the device under test, it is very helpful to get a fast indication of the CW optical power that is launched into the LCA receiver. The cause might be a bad connection or a bent fiber in the setup. For this reason too, a measurement of the average optical power at the LCA receiver is very helpful for fast debugging of the test setup. Selectable output power of the transmitter Most PIN diodes and receiver optical subassemblies need to be characterized at various average optical power levels. In this case it is necessary to set the average input power of the device under test to the desired value. The variable average optical output power of the LCA transmitter offers this feature. Together with an external optical attenuator, this range can be extended to all desired optical power levels. Group delay and length measurements In some applications it is necessary to determine the electrical or optical length of a device. With the internal length calibration of the electro-optical paths with reference to the electrical and optical inputs or outputs, it is possible to determine the length of the device under test External optical source input For applications where test of opto-electric devices need to be done at a specific optical wavelength like proposed in the IEEE 802.3ba standard, the N4373C-050 option offers an external optical input to the internal modulator where an external tunable laser can be applied. As modulators are polarization sensitive devices, this input is a PMF input to a PMF optical switch to maintain the polarization at the internal modulator and keep loss at a minimum. This external optical source input is required when O/E devices with integrated filter are to be characterized, or generaly when the O/E converter needs to be tested at different wavelengths than the internal source. www..com 4 Definitions Generally, all specifications are valid at the stated operating and measurement conditions and settings, with uninterrupted line voltage. Explanation of terms Responsivity For electro-optical devices (e.g. modulators ) this describes the ratio of the optical modulated output signal amplitude compared to the RF input amplitude of the device. For opto-electrical devices (e.g. photodiodes) this describes the ratio of the RF amplitude at the device output to the amplitude of the modulated optical signal input. Specifications (guaranteed) Describes warranted product performance that is valid under the specified conditions. Specifications include guard bands to account for the expected statistical performance distribution, measurement uncertainties changes in performance due to environmental changes and aging of components. Relative frequency response uncertainty Describes the maximum deviation of the shape of a measured trace from the (unknown) real trace. This specification has strong influence on the accuracy of the 3-dB cut-off frequency determined for the device under test. Typical values (characteristics) Characteristics describe the product performance that is usually met but not guaranteed. Typical values are based on data from a representative set of instruments. Absolute frequency response uncertainty Describes the maximum difference between any amplitude point of the measured trace and the (unknown) real value. This specification is useful to determine the absolute responsivity of the device versus modulation frequency. General characteristics Give additional information for using the instrument. These are general descriptive terms that do not imply a level of performance. Frequency response repeatability Describes the deviation of repeated measurement without changing any parameter or connection relative to the average of this measurements. Minimum measurable frequency response Describes the average measured responsivity when no modulation signal is present at the device under test. This represents the noise floor of the measurement system. Definition of LCA input and output names www..com LCA electrical port A LCA electrical port B LCA optical output LCA optical input 5 Measurement capabilities 3dB cut-off frequency (S21), Responsivity (S21), Electrical reflection (S11 or S22), Group Delay vs. frequency, Insertion Loss (IL), Transmission bandwidth, all electrical S-parameter measurements. Target test devices Transmitter (E/O) Agilent N4373C Specifications Measurement conditions Network analyzer set to -8 dBm electrical output power Modulation frequency range from 10 MHz to 65 GHz Number of averages: 1 100 Hz IFBW ("Reduce IF bandwidth at low frequency" enabled) with modulation frequency step size 10 MHz and measurement points on a 10 MHz raster (if not differently stated). Network analyzer set to "stepped sweep" - sweep moves in discrete steps" Port 2 of network analyzer configured in reverse coupler configuration ("RCVB B in" to "CPLR THRU", "SOURCE OUT" to "CPLR ARM") After full two-port electrical calibration using an Electronic Calibration Module, Agilent N4694A, at constant temperature (1 C). Modulation-bias optimization set to "every sweep" Using the supplied flexible test port cables 1.85mm f m (Part Number N4697-60200). Measurement frequency grid equals electrical calibration grid. Tested from Port 1 to Port 2. DUT signal delay 0.1/IF-BW. Specified temperature range: +20 C to +26 C. After warm-up time of 90 minutes. Using high quality electrical and optical connectors in perfect condition. Using internal laser source. Receiver (O/E) PIN diodes Avalanche photodiodes (APD) Receiver optical subassemblies (ROSA) Optical (O/O) Passive optical components Optical fibers and filters Optical transmission systems www..com 6 Transmitter and Receiver Specifications Optical Test set Operation frequency range Connector type optical input optical output optical source input (rear) RF LCA optical input Operating input wavelength range Maximum linear average input power [f1] 1290 nm to 1610 nm [f4] Optical input 1: Optical input 2: Maximum safe average input power Optical return loss (typ.) [f1] Average power measurement range [f1] Option -302, -392 10 MHz to 67 GHz SMF angled with Agilent versatile connector interface PMF angled, with Agilent versatile connector interface, polarization orientation aligned with connector key 1.85 mm male +4 dBm @ 1310 nm +5 dBm @ 1550 nm +14 dBm @ 1310 nm +15 dBm @ 1550 nm +7 dBm +17 dBm -25 dBm to +5 dBm on optical input 1 -15 dBm to +15 dBm on optical input 2 Optical input 1: Optical input 2: > 25 dBo Optical input 1: Optical input 2: 0.5 dBo Average power measurement uncertainty (typ.) [f1] LCA optical output (internal source) Optical modulation index (OMI) (typ.) Output wavelength Average output power range Average output power uncertainty (typ.)[f2] Average output power stability, 15 minutes (typ.) > 5 % @ -8 dBm RF power @ 1 GHz modulation frequency (option -100, 102) (1310 10) nm (option -101, 102) (1550 20) nm -1 dBm to +5 dBm @ 1550 nm -2 dBm to +4 dBm @ 1310 nm 0.5 dBo 0.5 dBo External optical source input (-050) Required optical input power [f3] Optical input power damage level Typical loss at quadrature bias point Operating input wavelength range +8 to + 15 dBm +20 dBm 9 dB 1290 nm to 1610 nm [f4] LCA RF test port input Maximum safe www..com input level at port A or B +15 dBm RF, 7V DC [f1] Wavelength within range as specified for LCA optical output. [f2] After modulator optimization. [f3] Required source characteristics: SMSR > 35dB, linewidth < 10MHz, power stability < 0.1dB pp, PER > 20dB, unmodulated, single mode. [f4] Excluding water absorption wavelength. 7 Specifications for electro to optical measurements at 1310 nm N4373C system with network analyzer E8361C/A -014 (E/O mode) Specifications are valid under the stated measurement conditions. At optical input 1 ("+ 7 dBm max"). At optical input 2 ("+ 17 dBm max"), specifications are typically the same for 10 dB higher incident average and modulated optical power. For wavelength: (1310 10) nm (option -100,102). System performance Relative frequency response uncertainty DUT response -24 dB(W/A) [f1] 0.8 dBe typ. -34 dB(W/A) (typical) -44 dB(W/A) (typical) Absolute frequency response uncertainty DUT response 24 dB(W/A) [f1] 1.7 dBe typ 0.03 dBe 0.03 dBe 0.03 dBe -64 dB(W/A) 2.4 dBe 2.6 dBe 2.7 dBe 3.2 dBe (1.7 dBe typ) (1.8 dBe typ) (1.9 dBe typ) (2.2 dBe typ) 0.03 dBe 0.03 dBe 0.03 dBe -64 dB(W/A) 0.05 dBe 0.11 dBe 0.6 dBe -64 dB(W/A) 0.15 dBe 0.4 dBe 1.3 dBe -64 dB(W/A) 0.25 dBe 0.8 dBe 2.2 dBe -59 dB(W/A) 0.8 dBe 0.9 dBe 1.0 dBe 1.1 dBe 1.1 dBe 2.4 dBe (0.7 dBe typ) (0.8 dBe typ) (0.8 dBe typ) (1.7 dBe typ) 0.8 dBe 0.9 dBe 0.8 dBe 0.9 dBe 0.8 dBe 2.2 dBe 1.8 dBe 4.0 dBe 0.05 GHz to 0.2 GHz 0.2 GHz to 0.7 GHz 0.7 GHz to 20 GHz 20 GHz to 50 GHz 50 GHz to 65 GHz Frequency response DUT response repeatability (typ) -24 dB(W/A)[f1] -34 dB(W/A) -44 dB(W/A) Minimum measurable frequency response (noise floor ) [f2] [f4] Phase uncertainty (typ.) [f3] DUT response -24 dB(W/A) [f1] -34 dB(W/A) Group delay uncertainty 3.5 3.5 3.0 3.5 2.7 2.7 3.7 4.8 5.5 9.0 Derived from phase uncertainty, see section "Group delay uncertainty". Example: 2.0 8 ps (1 GHz aperture) [f1] [f2] [f3] [f4] For DUT response max. -13 dB(W/A). IFBW = 10 Hz. Except phase wrap aliasing (example: a DUT group delay of 5 ns (1 m cable length) requires a frequency step size of 0.2 GHz to avoid phase wraps). Excluding a constant group delay offset of <0.3 ns typ. (cable length uncertainty < 0.06 m). A constant group delay offset leads to a phase offset = 360 x GD x fmod (in deg). Average value over frequency range. www..com 8 Specifications for electro to optical measurements at 1550 nm N4373C system with network analyzer E8361C/A -014 (E/O mode) Specifications are valid under the stated measurement conditions. At optical input 1 ("+ 7 dBm max"). At optical input 2 ("+ 17 dBm max"), specifications are typically the same for 10 dB higher incident average and modulated optical power. For wavelength: (1550 20) nm (option -101, 102). System performance Relative frequency response uncertainty DUT response -26 dB(W/A) [f1] 0.7 dBe typ. -36 dB(W/A) (typical) -46 dB(W/A) (typical) Absolute frequency response uncertainty DUT response -26 dB(W/A) [f1] 1.2 dBe typ 0.02 dBe 0.02 dBe 0.02 dBe -64 dB(W/A) 1.8 dBe 1.8 dBe 1.9 dBe 2.7 dBe (1.2 dBe typ) (1.2 dBe typ) (1.2 dBe typ) (1.8 dBe typ) 0.02 dBe 0.02 dBe 0.02 dBe -64 dB(W/A) 0.02 dBe 0.02 dBe 0.1 dBe -64 dB(W/A) 0.1 dBe 0.3 dBe 1 dBe -64 dB(W/A) 0.2 dBe 0.5 dBe 2.0 dBe -59 dB(W/A) 0.7 dBe 0.7 dBe 0.8 dBe 0.8 dBe 1.0 dBe 1.6 dBe (0.6 dBe typ) (0.6 dBe typ) (0.7 dBe typ) (1.1 dBe typ) 0.6 dBe 0.7 dBe 0.6 dBe 0.7 dBe 0.9 dBe 1.6 dBe 1.3 dBe 2.7 dBe 0.05 GHz to 0.2 GHz 0.2 GHz to 0.7 GHz 0.7 GHz to 20 GHz 20 GHz to 50 GHz 50 GHz to 65 GHz Frequency response DUT response repeatability (typ) -26 dB(W/A)[f1] -36 dB(W/A) -46 dB(W/A) Minimum measurable frequency response (noise floor ) [f2] [f4] Phase uncertainty (typ.) [f3] DUT response -26 dB(W/A) [f1] -36 dB(W/A) Group delay uncertainty 3.5 5.5 3.0 3.5 2.3 2.3 3.2 4.2 4.5 6.5 Derived from phase uncertainty, see section "Group delay uncertainty". Example: 2.0 8 ps (1 GHz aperture) [f1] [f2] [f3] [f4] For DUT response max. -13 dB(W/A). IFBW = 10 Hz. Except phase wrap aliasing (example: a DUT group delay of 5 ns (1 m cable length) requires a frequency step size of 0.2 GHz to avoid phase wraps). Excluding a constant group delay offset of <0.3 ns typ. (cable length uncertainty < 0.06 m). A constant group delay offset leads to a phase offset = 360 x GD x fmod (in deg). Average value over frequency range. www..com 9 Specifications for optical to electrical measurements at 1310 nm N4373C system with network analyzer E8361C/A -014 (O/E mode) Specifications are valid under the stated measurement conditions. For external source optical input all specifications are typical [f2][f5][f6]. For wavelength: (1310 10) nm (option -100,102) System performance Relative frequency response uncertainty [f2] DUT response -19 dB(A/W) [f1] 0.05 GHz to 0.2 GHz 0.2 GHz to 0.7 GHz 1.0 dBe (0.7 dBe [f7] ) 0.7 dBe 0.9 dBe 0.7 GHz to 20 GHz 1.1 dBe (0.8 dBe [f7] ) 0.8 dBe 0.9 dBe 20 GHz to 50 GHz 1.7 dBe (1.2 dBe [f7]) 1.3 dBe 1.7 dBe 50 GHz to 65 GHz 2.2 dBe (1.5 dBe [f7]) 1.6 dBe 2.8 dBe 0.8 dBe typ. -29 dB(A/W) (typical) -39 dB(A/W) (typical) 0.8 dBe 0.9 dBe Absolute DUT response frequency response -29 dB(A/W) [f1] uncertainty f2] Frequency response repeatability (typ) f2] DUT response -19 dB(A/W)[f1] -29 dB(A/W) -39 dB(A/W)) Minimum measurable frequency response (noise floor ) [f2] [f3][f8] Phase uncertainty (typ.) [f2,f4] DUT response -19 dB(A/W) [f1] -29 dB(A/W) Group delay uncertainty (1.5 dBe [f7] ) 0.03 dBe 0.03 dBe 0.03 dBe -60 dB(A/W) 2.4 dBe (1.5 dBe [f7]) 0.03 dBe 0.03 dBe 0.03 dBe -60 dB(A/W) 2.4 dBe (1.5 dBe [f7]) 0.05 dBe 0.15 dBe 0.3 dBe -60 dB(A/W) 2.8 dBe (1.8 dBe [f7]) 0.3 dBe 0.5 dBe 0.5 dBe -60 dB(A/W) 3.2 dBe (2.1 dBe [f7]) 0.5 dBe 0.7 dBe 0.8 dBe -55 dB(A/W) 3.5 5.5 3.0 3.5 2.7 2.7 4.4 4.9 6.0 7.5 Derived from phase uncertainty, see section "Group delay uncertainty". Example: 2.0 8 ps (1 GHz aperture) [f1] [f2] [f3] [f4] [f5] [f6] [f7] [f8] For DUT response max. -10 dB(A/W). For +4 dBm average output power from LCA optical output. IFBW = 10 Hz. Except phase wrap aliasing (example: a DUT group delay of 5 ns (1 m cable length) requires a frequency step size of 0.2 GHz to avoid phase wraps). Excluding a constant group delay offset of <0.3 ns typ. (cable length uncertainty <0.06 m). A constant group delay offset leads to a phase offset = 360 x GD x fmod.(in deg). After CW responsivity and user calibration with external source. Requires option -100 or -102. Typical with internal source. Average value over frequency range. www..com 10 Specifications for optical to electrical measurements at 1550 nm N4373C system with network analyzer E8361C/A -014 (O/E mode) Specifications are valid under the stated measurement conditions. For external source optical input all specifications are typical [f2][f5][f6]. For wavelength: (1550 20) nm (option -101,102) System performance Relative frequency response uncertainty [f2] DUT response -15 dB(A/W)[f1] 0.05 GHz to 0.2 GHz 0.2 GHz to 0.7 GHz 0.8 dBe (0.6 dBe [f7]) 0.7 dBe 0.7 dBe 0.7 GHz to 20 GHz 0.9 dBe (0.7 dBe [f7]) 0.8 dBe 0.8 dBe 20 GHz to 50 GHz 1.2 dBe (0.8 dBe [f7]) 0.9 dBe 1.3 dBe 50 GHz to 65 GHz 1.9 dBe (1.3 dBe [f7]) 1.4 dBe 1.7 dBe 0.7 dBe typ. -25 dB(A/W) (typical) -35 dB(A/W) (typical) 0.8 dBe. 0.8 dBe. Absolute DUT response frequency response -25 dB(A/W) [f1] uncertainty f2] Frequency response repeatability (typ) f2] DUT response -15 dB(A/W)[f1] -25 dB(A/W) -35 dB(A/W)) Minimum measurable frequency response (noise floor ) [f2] [f3][f8] Phase uncertainty (typ.) [f2,f4] DUT response -15 dB(A/W) [f1] -25 dB(A/W) Group delay uncertainty (1.1 dBe [f7] ) 0.02 dBe 0.02 dBe 0.02 dBe -60 dB(A/W) 1.9 dBe (1.1 dBe [f7]) 0.02 dBe 0.02 dBe 0.02 dBe -60 dB(A/W) 1.9 dBe (1.1 dBe [f7]) 0.02 dBe 0.02 dBe 0.06 dBe -60 dB(A/W) 2.0 dBe (1.2 dBe [f7]) 0.3 dBe 0.5 dBe 0.5 dBe -60 dB(A/W) 2.8 dBe (1.6 dBe [f7]) 0.5 dBe 0.7 dBe 0.8 dBe -55 dB(A/W) 3.5 5.5 3.0 3.5 2.4 2.4 3.2 5.0 5.0 7.0 Derived from phase uncertainty, see section "Group delay uncertainty". Example: 2.0 8 ps (1 GHz aperture) [f1] [f2] [f3] [f4] [f5] [f6] [f7] [f8] For DUT response max. -10 dB(A/W). For +5 dBm average output power from LCA optical output.. IFBW = 10 Hz. Except phase wrap aliasing (example: a DUT group delay of 5 ns (1 m cable length) requires a frequency step size of 0.2 GHz to avoid phase wraps). Excluding a constant group delay offset of <0.3 ns typ. (cable length uncertainty <0.06 m). A constant group delay offset leads to a phase offset = 360 x GD x fmod.(in deg). After CW responsivity and user calibration with external source. Requires option -101 or -102. Typical with internal source. Average value over frequency range. www..com 11 Specifications for optical to optical measurements at 1310 nm N4373C system with network analyzer E8361C/A -014 (O/O mode) Specifications are valid under the stated measurement conditions. At optical input 1 ("+7 dBm max"). At optical input 2 ("+17 dBm max"), specifications are typically the same for 10 dB higher incident average and modulated optical power. For external source optical input all specifications are typical [f2][f5][f6]. For wavelength: (1310 10) nm (option -100, 102) System performance Relative frequency response uncertainty f2] DUT response -3 dBe ( -1.5 dBo) [f4] -13 dBe ( -6.5 dBo) (typical) -23 dBe ( -11.5 dBo) (typical) Absolute frequency response uncertainty f2] DUT response -3 dBe (-1.5 dBo) [f4] 0.05 GHz to 0.2 GHz 0.4 dBe typ. (0.2 dBo) 0.2 dBe (0.1 dBo). 0.2 dBe (0.1 dBo). 0.2 GHz to 0.7 GHz 0.4 dBe (0.2 dBo) 0.2 dBe (0.1 dBo) 0.2 dBe (0.1 dBo) 0.7 GHz to 20 GHz 0.4 dBe (0.2 dBo) 0.2 dBe (0.1 dBo) 0.2 dBe (0.1 dBo) 20 GHz to 50 GHz 0.5 dBe (0.25 dBo) 0.7 dBe (0.35 dBo) 0.9 dBe (0.45 dBo) 50 GHz to 65 GHz 0.6 dBe (0.3 dBo) 1.0 dBe (0.5 dBo) 1.5 dBe (0.75 dBo) 0.9 dBe typ. (0.45 dBo) 0.02 dBe 0.03 dBe 0.03 dBe -55 dBe typ. (-27.5 dBo) 3.5 5.5 0.9 dBe (0.45 dBo) 0.02 dBe 0.03 dBe 0.03 dBe -42 dBe (-21 dBo) 3.0 3.5 0.9 dBe (0.45 dBo) 0.03 dBe 0.1 dBe 0.1 dBe -42 dBe (-21 dBo) 2.2 2.2 1.0 dBe (0.50 dBo) 0.15 dBe 0.4 dBe 1 dBe -42 dBe (-21 dBo) 2.7 3.3 1.2 dBe (0.6 dBe) 0.3 dBe 0.8 dBe 1.5 dBe -36 dBe (-18 dBo ) 3.5 4.0 Frequency response DUT response repeatability (typ.) f2] -3 dBe ( -1.5 dBo) [f4] -13 dBe ( -6.5 dBo) -23 dBe ( -11.5 dBo) Minimum measurable frequency response (noise floor ) [f1] [f2][f7] Phase uncertainty (typ.) [f2,f3] DUT response -3 dBe [f4] (-1.5 dBo) -13 dBe (-6.5 dBo) Group delay uncertainty Derived from phase uncertainty, see section "Group delay uncertainty". Example: 2.0 8 ps (1 GHz aperture) www..com [f1] [f2] [f3] [f4] [f5] [f6] [f7] IFBW = 10 Hz. For +4 dBm average output power from LCA optical output. Except phase wrap aliasing (example: a DUT group delay of 5 ns (1 m cable length) requires a frequency step size of 0.2 GHz to avoid phase wraps). For DUT response max. +6 dBe (+3 dBo) gain. After CW responsivity and user calibration with external source. Requires option -100 or -102. Average value over frequency range. 12 Specifications for optical to optical measurements at 1550 nm N4373C system with network analyzer E8361C/A -014 (O/O mode) Specifications are valid under the stated measurement conditions. At optical input 1 ("+7 dBm max"). At optical input 2 ("+17 dBm max"), specifications are typically the same for 10 dB higher incident average and modulated optical power. For external source optical input all specifications are typical [f2][f5][f6] For wavelength: (1550 20) nm (option -101,102) System performance Relative frequency response uncertainty f2] DUT response -3 dBe ( -1.5 dBo) [f4] -13 dBe ( -6.5 dBo) (typical) -23 dBe ( -11.5 dBo) (typical) Absolute frequency response uncertainty f2] DUT response -3 dBe (-1.5 dBo) [f4] 0.05 GHz to 0.2 GHz 0.3 dBe typ. (0.15 dBo) 0.2 dBe (0.1 dBo). 0.2 dBe (0.1 dBo). 0.2 GHz to 0.7 GHz 0.3 dBe (0.15 dBo) 0.2 dBe (0.1 dBo) 0.2 dBe (0.1 dBo) 0.7 GHz to 20 GHz 0.3 dBe (0.15 dBo) 0.2 dBe (0.1 dBo) 0.3 dBe (0.15 dBo) 20 GHz to 50 GHz 0.4 dBe (0.2 dBo) 0.6 dBe (0.3 dBo) 0.7 dBe (0.35 dBo) 50 GHz to 65 GHz 0.6 dBe (0.3 dBo) 1.0 dBe (0.5 dBo) 1.3 dBe (0.65 dBo) 0.4 dBe typ. (0.2 dBo) 0.02 dBe 0.02 dBe 0.02 dBe -55 dBe typ. (-27.5 dBo) 3.5 5.5 0.4 dBe (0.2 dBo) 0.02 dBe 0.02 dBe 0.02 dBe -42 dBe (-21 dBo) 3.0 3.5 0.4 dBe (0.2 dBo) 0.02 dBe 0.02 dBe 0.1 dBe -42 dBe (-21 dBo) 2.2 2.2 0.7 dBe (0.35 dBo) 0.1 dBe 0.3 dBe 1.0 dBe -42 dBe (-21 dBo) 2.6 3.0 0.9 dBe (0.45 dBe) 0.2 dBe 0.5 dBe 2.0 dBe -36 dBe (-18 dBo ) 3.0 3.5 Frequency response DUT response repeatability (typ.) f2] -3 dBe ( -1.5 dBo) [f4] -13 dBe ( -6.5 dBo) -23 dBe ( -11.5 dBo) Minimum measurable frequency response (noise floor ) [f1] [f2][f7] Phase uncertainty (typ.) [f2,f3] DUT response -3 dBe [f4] (-1.5 dBo) -13 dBe (-6.5 dBo) Group delay uncertainty Derived from phase uncertainty, see section "Group delay uncertainty". Example: 2.0 8 ps (1 GHz aperture) www..com [f1] [f2] [f3] [f4] [f5] [f6] [f7] IFBW = 10 Hz. For +5 dBm average output power from LCA optical output. Except phase wrap aliasing (example: a DUT group delay of 5 ns (1 m cable length) requires a frequency step size of 0.2 GHz to avoid phase wraps). For DUT response max. +6 dBe (+3 dBo ) gain. After CW responsivity and user calibration with external source. Requires option -100 or -102. Average value over frequency range. 13 Specifications for electrical-electrical measurements (E/E mode) All specifications of the E8361C-014 Network Analyzer apply. Please see the corresponding Network Analyzer data sheet and User's Guide. Group delay uncertainty For more details see specifications of the E8361C. Group delay Group delay is computed by measuring the phase change within a specified aperture (for aperture see below: Phase change [deg] ----------------------------------------Aperture [Hz] * 360 GD [s] = (1) Group delay uncertainty Is calculated from the specified phase uncertainty and from the aperture (for aperture see below): Phase uncertainty [deg] --------------------------------------- *sqrt(2) Aperture [Hz] * 360 GD [s] = (2) Aperture Determined by the frequency span and the number of points per sweep: Aperture: (frequency span) / (number of points-1) GD Range The maximum group delay is limited to measuring no more than 180 degrees of phase change within the selected aperture (see Equation 1). www..com 14 General Characteristics Assembled dimensions: (H x W x D) 41.3 cm x 43.8 cm x 47.3 cm, (16.3 in x 17.3 in x 18.7 in) Weight Product net weight: 38 kg (83.6 lbs) Packaged product: 58 kg (127.6 lbs) Power Requirements 100 to 240 V~, 50 to 60 Hz 2 power cables E8361C-014 max. 350 VA Optical test set: max. 40 VA Network-analyzer Option 302 E8361C-014 Storage temperature range -40 C to +70 C Operating temperature range +5 C to +35 C Humidity 15 % to 80 % relative humidity, non-condensing Altitude (operating) 0 ... 2000 m Recommended re-calibration period 1 year Shipping contents 1x Network-analyzer E8361C-014 1x N4373C optical test set 2x N4697-60200 f-m flexible test port MW cable 2x 85058-60121 test port adapter 1x N5520B-FG 1.85 mm (f)-(f), adapter DC - 67GHz 3x 81000NI optical adaptor www..com 1x 8121-1242 USB cable 1x 1150-7896 Keyboard 1x 1150-7799 Mouse 1x E5525-10285 UK 6 report 1x 4373B-90A01 Getting started 1x 4373B-90CD1 Support CD 2x Local power cord 15 1x RoHS addendum for Photonic T&M Accesoires 1x RoHS addendum for Photonic T&M products Additional, option dependent shipping contents: -021 straight connector: 2x N4373-87907 0.5m FC/APC - FC/PC patch cord 1x 1005-0256 FC/FC feedthrougth adapter -022 angled connector: 2x N4373-87906 0.5m FC/APC - FC/APC patch cord 1x 1005-1027 FC adaptor for angled-PC -050 external optical source input 1x PMF patchcord 1.0m FC/APC narrow key 1x 81000NI optical adaptor FC LCA connector types at optical testset LCA electrical input 1.85 mm (f) LCA electrical output 1.85 mm (m) LCA optical input 1 9um single-mode angled [1], with Agilent universal adapter LCA optical input 2 9um single-mode angled [1], with Agilent universal adapter LCA optical output 9um single-mode angled[1], with Agilent universal adapter LCA external source input 9um polarization maintaining (Option -050 only) single-mode angled, with Agilent universal adapter The optical test set always has angled connectors. Depending on the selected option (-021 straight, -022 angled) the appropriate jumper cable will be delivered. This jumper cable must always be used in front to the optical test set to protect the connectors at the optical test set [1] Laser Safety Information All laser sources listed above are classified as Class 1M according to IEC 60825 1 (2001). All laser sources comply with 21 CFR 1040.10 except for deviations pursuant to Laser Notice No. 50, dated 2001-July-26. Mechanical Outline Drawings, option -302, -392 (all dimensions in mm) www..com 16 Ordering informations The N4373C consists of an optical test set and an electrical network analyzer which are mechanically connected. To protect your network analyzer investment, Agilent offers the integration of an already owned PNA with the optical test set as listed below. All systems have 1 year warranty. N4373C LCA ordering options Network-analyzer options N4373C - 302 Network-analyzer integration options N4373C - 392 Integration of customer's 67 GHz, 2 port PNA (E8361A/C-014, 010) all other NWA and options call factory 67 GHz, 2 port PNA (E8361C-014) Optical wavelength options N4373C-100 N4373C-101 N4373C-102 Configuration independent options N4373C-010 N4373C-050 N4373C-021 N4373C-022 Service and Repair R1280A R1282A Required accessories ( to be ordered separately) N4694A 2 port MW Electrical Calibration Module ( -00F recommended) 1 year Return-to-Agilent warranty extended to 3 or 5 years Calibration up front support plan 3 or 5 year coverage Time Domain Operation for Networkanalyzer Testset with external optical source Input Straight Fiber Interface single mode Angled Fiber Interface single mode 1310nm Single Wavelength Source 1550nm Single Wavelength Source 1310 & 1550 nm Dual Wavelength Source www..com 17 Agilent Email Updates www.agilent.com/find/emailupdates Remove all doubt Our repair and calibration services will get your equipment back to you, performing like new, when promised. You will get full value out of your Agilent equipment throughout its lifetime. Your equipment will be serviced by Agilent-trained technicians using the latest factory calibration procedures, automated repair diagnostics and genuine parts. You will always have the utmost confidence in your measurements. Agilent offers a wide range of additional expert test and measurement services for your equipment, including initial start-up assistance, onsite education and training, as well as design, system integration, and project management. For more information on repair and calibration services, go to: www.agilent.com/find/removealldoubt www.agilent.com www.agilent.com/find/lca For more information on Agilent Technologies' products, applications or services, please contact your local Agilent office. The complete list is available at: Get the latest information on the products and applications you select. Agilent Direct www.agilent.com/find/agilentdirect www.agilent.com/find/contactus Americas Canada Latin America United States Asia Pacific Australia China Hong Kong India Japan Korea Malaysia Singapore Taiwan Thailand Quickly choose and use your test equipment solutions with confidence. Agilent Open (877) 894-4414 305 269 7500 (800) 829-4444 www.agilent.com/find/open Agilent Open simplifies the process of connecting and programming test systems to help engineers design, validate and manufacture electronic products. Agilent offers open connectivity for a broad range of system-ready instruments, open industry software, PC-standard I/O and global support, which are combined to more easily integrate test system development. 1 800 629 485 800 810 0189 800 938 693 1 800 112 929 0120 (421) 345 080 769 0800 1 800 888 848 1 800 375 8100 0800 047 866 1 800 226 008 Optical instruments online information www.lxistandard.org LXI is the LAN-based successor to GPIB, providing faster, more efficient connectivity. Agilent is a founding member of the LXI consortium. Optical test instruments www.agilent.com/find/oct Europe & Middle East Austria 01 36027 71571 Belgium 32 (0) 2 404 93 40 Denmark 45 70 13 15 15 Finland 358 (0) 10 855 2100 France 0825 010 700* *0.125 /minute Germany 07031 464 6333** **0.14 /minute Lightwave Component Analyzers www.agilent.com/find/lca Polarization solutions www.agilent.com/find/pol Spectral analysis products www.agilent.com/find/octspectral Electro-optical converters www.agilent.com/find/ref Ireland 1890 924 204 Israel 972-3-9288-504/544 Italy 39 02 92 60 8484 Netherlands 31 (0) 20 547 2111 Spain 34 (91) 631 3300 Sweden 0200-88 22 55 Switzerland 0800 80 53 53 United Kingdom 44 (0) 118 9276201 Other European Countries: www.agilent.com/find/contactus Revised: July 17, 2008 Optical test instruments accesories www.agilent.com/find/octaccessories Firmware and driver download www..com www.agilent.com/find/octfirmware Product specifications and descriptions in this document subject to change without notice. (c) Agilent Technologies, Inc. 2008 Printed in USA, February 18th. 2009 5989-9201EN Agilent photonic discussion forum www.agilent.com/find/photonic_forum |
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